MEASUREMENT DEVICE AND MEASURING METHOD USING SIMULATED UPLINK FADING

A measuring device for measuring a reaction of a device under test to an uplink channel quality parameter, indicating a quality of a transmission channel from the device under test to the measuring device, comprises signal generation means, set up for generating a first signal including the uplink c...

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1. Verfasser: GRUBER INGO
Format: Patent
Sprache:eng
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