MEASUREMENT DEVICE AND MEASURING METHOD USING SIMULATED UPLINK FADING

A measuring device for measuring a reaction of a device under test to an uplink channel quality parameter, indicating a quality of a transmission channel from the device under test to the measuring device, comprises signal generation means, set up for generating a first signal including the uplink channel quality parameter. The uplink channel quality parameter is set by the signal generation means independent from an actual channel quality of the transmission channel. Transmission means is set up for transmitting a second signal, which is derived from the first signal or is identical to the first signal to the device under test. Receiving means is set up for receiving a third signal transmitted by the device under test and created by the device under test based upon the uplink channel quality parameter and for determining the reaction of the device under test to the uplink channel quality parameter.