SYSTEMS AND METHODS FOR DEFINING A SURFACE CONTOUR OF A LAYERED CHARGE OF MATERIAL

Systems and methods for defining a surface contour of a layered charge of material are disclosed herein. The systems include a forming die, which includes a forming surface shaped to define a desired surface contour of the layered charge, and a fluidly actuated support, which includes a support surf...

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Hauptverfasser: COXON BRAD ANDREW, WILLDEN KURTIS SHULDBERG, DAVIS KIERAN P
Format: Patent
Sprache:eng
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Zusammenfassung:Systems and methods for defining a surface contour of a layered charge of material are disclosed herein. The systems include a forming die, which includes a forming surface shaped to define a desired surface contour of the layered charge, and a fluidly actuated support, which includes a support surface that is adjacent to the forming surface and located to support the layered charge. The systems further include a vacuum bag that at least partially defines an enclosed volume and a vacuum source configured to selectively apply a vacuum to the enclosed volume. The methods include locating the layered charge on the forming surface and on the support surface, covering the layered charge with the vacuum bag to define the enclosed volume, applying the vacuum to the enclosed volume, compressing the fluidly actuated support, translating the support surface, and deforming the layered charge to define the desired surface contour.