METHOD AND APPARATUS FOR DISCOVERING EQUIPMENT CAUSING PRODUCT DEFECT IN MANUFACTURING PROCESS

A method for determining defect causing equipment in a manufacturing process includes collecting equipment sequence data and processing result data of a plurality of products, calculating defect contribution scores for a plurality of equipment based on the collected data, and applying a modified ass...

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Bibliographische Detailangaben

Hauptverfasser:	TONG SEUNG HOON, LEE HOYEOP, KO JONG MYOUNG, KIM CHANG OUK, CHOI DOOWON
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION ORPROCESSING OF GOODS CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY FUNCTIONAL ELEMENTS OF SUCH SYSTEMS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING SEMICONDUCTOR DEVICES TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINSTCLIMATE CHANGE
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