METHOD AND APPARATUS FOR DISCOVERING EQUIPMENT CAUSING PRODUCT DEFECT IN MANUFACTURING PROCESS

A method for determining defect causing equipment in a manufacturing process includes collecting equipment sequence data and processing result data of a plurality of products, calculating defect contribution scores for a plurality of equipment based on the collected data, and applying a modified ass...

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Bibliographische Detailangaben
Hauptverfasser:	TONG SEUNG HOON, LEE HOYEOP, KO JONG MYOUNG, KIM CHANG OUK, CHOI DOOWON
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION ORPROCESSING OF GOODS CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY FUNCTIONAL ELEMENTS OF SUCH SYSTEMS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING SEMICONDUCTOR DEVICES TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINSTCLIMATE CHANGE
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Beschreibung
Zusammenfassung:	A method for determining defect causing equipment in a manufacturing process includes collecting equipment sequence data and processing result data of a plurality of products, calculating defect contribution scores for a plurality of equipment based on the collected data, and applying a modified association rule to the equipment based on the calculated contributions scores. The modified association rule to generate rules reflecting a cumulative effect of an equipment sequence and equipment contributing to a defect of at least some of the products. The method also includes calculating a defect-introducing index based on the calculated contribution scores and the modified association rule, and identifying at least one of the plurality of equipment as causing the defect of the products based on the defect-introducing index.