GUIDE AND SUPPORT MEMBER FOR A DEVICE FOR TESTING ELECTRONIC COMPONENTS

GUIDE AND SUPPORT MEMBER FOR A DEVICE FOR TESTING ELECTRONIC COMPONENTS

Embodiments of the invention come up from a guide and support member within a device for testing electronic components, which guide and support member can be moved into a feeding position and into a testing position, the guide and support member with a base body for accommodating an electronic compo...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: STANISZEWSKI GERALD, POETZINGER JOHANN, KRONTHALER SIMON
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:Embodiments of the invention come up from a guide and support member within a device for testing electronic components, which guide and support member can be moved into a feeding position and into a testing position, the guide and support member with a base body for accommodating an electronic component to be tested, with at least one support for supporting contact springs of the electronic component to be tested, and with at least one stopper that stops the movement of the electronic component to be tested at one of its contact springs once the electronic component to be tested is in an exact position. According to the invention, the at least one support comprises a ceramic material, wherein the stopper is anchored in the base body.