ENCLOSURE DIAGNOSTIC AND CONTROL SYSTEMS

An enclosure diagnostic and control system is described herein. The system can include a controller having a storage repository, where the storage repository includes at least one threshold value and at least one algorithm. The system can also include an enclosure communicably coupled to the control...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	ROTHENBERGER RICHARD E, BONACCIO JOHN M, FREER BENJAMIN AVERY, MANAHAN JOSEPH MICHAEL, IANNCE STEPHAN P
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	An enclosure diagnostic and control system is described herein. The system can include a controller having a storage repository, where the storage repository includes at least one threshold value and at least one algorithm. The system can also include an enclosure communicably coupled to the controller and electrically coupled to a field device. The system can further include a number of sensors communicably coupled to the controller, where the sensors measure a number of field values of a number of parameters associated with the field device. The controller can evaluate the field values using the at least one algorithm to generate an evaluated value. The controller can output a control signal based on the evaluated value.