INTEGRATED HARDWARE AND SOFTWARE FOR PROBE

A computing device is described. The computing device may include a port to receive voltage from a probe. The computing device may include logic at least partially comprising hardware to determine a resistance level associated with the voltage. The logic may route the voltage based on the resistance...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	WANG MINGLEI, KANE KAPIL, BEAUREGARD RUSSELL
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC ORINFRASONIC WAVES MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR MEASURING QUANTITY OF HEAT MEASURING TEMPERATURE PHYSICS TARIFF METERING APPARATUS TESTING THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	A computing device is described. The computing device may include a port to receive voltage from a probe. The computing device may include logic at least partially comprising hardware to determine a resistance level associated with the voltage. The logic may route the voltage based on the resistance level. The logic may associate the resistance level with a specific context.