METHODS AND APPARATUS FOR ANALYZING EFFECTS OF FRICTION ON PROCESS CONTROL DEVICES
Methods and apparatus for analyzing effects of friction on process control devices are disclosed herein. An example apparatus includes a housing; a processor disposed in the housing, the processor to: determine a first force or torque corresponding to friction of a process control device and an actu...
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Methods and apparatus for analyzing effects of friction on process control devices are disclosed herein. An example apparatus includes a housing; a processor disposed in the housing, the processor to: determine a first force or torque corresponding to friction of a process control device and an actuator operatively coupled to the process control device via a stem or shaft; in response to the first force or torque, determine a first command to operate the process control device via the stem or shaft to obtain a first response of the actuator; determine a second force or torque corresponding to friction of the process control device and the actuator; and in response to the second force or torque, determine a second command to operate the process control device via the stem or shaft to obtain a second response of the actuator. |
---|