FAST ON-CHIP OSCILLATOR TRIMMING

Oscillation frequency measurements for trimming oscillators on an integrated circuit device are performed entirely on the device. The oscillation frequency measurements utilize a reference clock. Some measurements count periods of the oscillator signal independently of the reference clock, and some...

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Bibliographische Detailangaben
Hauptverfasser:	MOUSHEGIAN KEN, HARRINGTON CORMAC, ALLEMAN ANDREW, GRANT DAVID A, WEGNER HAGEN
Format:	Patent
Sprache:	eng
Schlagworte:	AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATIONOF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES BASIC ELECTRONIC CIRCUITRY ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	Oscillation frequency measurements for trimming oscillators on an integrated circuit device are performed entirely on the device. The oscillation frequency measurements utilize a reference clock. Some measurements count periods of the oscillator signal independently of the reference clock, and some measurements count periods of the reference clock independently of the oscillator signal. After one oscillator on the device has been trimmed, that trimmed oscillator may then be used to make oscillation frequency measurements for trimming another oscillator on the device.