CALIBRATION PLATE FOR MEASURING CALIBRATION OF A DIGITAL MICROSCOPE AND METHODS OF USING THE SAME

A calibration plate for measuring calibration of digital microscope and methods of using the same. The calibration plate comprises at least one calibration area formed with a surface structure which includes a plurality of grid cells arranged periodically, wherein at least part of boundary and/or at...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: LI ZHONGYU, NAGEL PATRICK, GU HAILEI
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:A calibration plate for measuring calibration of digital microscope and methods of using the same. The calibration plate comprises at least one calibration area formed with a surface structure which includes a plurality of grid cells arranged periodically, wherein at least part of boundary and/or at least part of apexes of each grid cell can be identified by an optical imaging system of the digital microscope. The invention also includes a digital microscope system equipped with the calibration plate.