FUSE CIRCUIT WITH TEST MODE

FUSE CIRCUIT WITH TEST MODE

During a program operation of a fuse cell of a fuse circuit, all of a group of select transistors of a fuse cell are made conductive to program the fuse cell. During a test operation of a fuse cell of the fuse circuit, less than all of the group of select transistors are made conductive so that curr...

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Bibliographische Detailangaben
1. Verfasser: HOEFLER ALEXANDER B
Format: Patent
Sprache:eng
Schlagworte:
INFORMATION STORAGE
PHYSICS
STATIC STORES
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Beschreibung
Zusammenfassung:During a program operation of a fuse cell of a fuse circuit, all of a group of select transistors of a fuse cell are made conductive to program the fuse cell. During a test operation of a fuse cell of the fuse circuit, less than all of the group of select transistors are made conductive so that current less than a programming current flows through the fuse cell.