DYNAMIC ADJUSTMENT OF DATA PROTECTION SCHEMES IN FLASH STORAGE SYSTEMS BASED ON TEMPERATURE, POWER OFF DURATION AND FLASH AGE

A data retention methodology for use in electrically rewritable nonvolatile storage systems is disclosed. The methodology collects characterization data of the storage system (e.g., time stamps, program/erase cycles, sensed temperature over time, and others) and uses at least a portion of that data to associate various data retention schemes with the collected characterization data. At power-on, the methodology determines a duration of a time during which power was not supplied to the storage system. The methodology also uses the power-on time to trigger the selection of an appropriate data protection scheme (e.g., enhanced ECC and/or read/scrub frequency). Dynamic selection and adjustment of the applied protection scheme may be based on the predetermined and/or calculated association between various protection schemes and the collected characterization data of the storage system.