METHOD OF PROCESSING A SUBSTRATE AND APPARATUS FOR PERFORMING THE SAME

In a method of processing a substrate, a first plasma may be generated from a first reaction gas. A second plasma may be generated from a second reaction gas. The first plasma and the second plasma may be individually applied to the substrate. Thus, each of the at least two remote plasma sources may...

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Bibliographische Detailangaben
Hauptverfasser: VLADMIR VOLYNETS, LEE SANG-HEON, KIM GON-JUN, JEON SANG-JEAN, PARK YONG-KYUN, KIM SAM HYUNG-SAM, SONG INOL
Format: Patent
Sprache:eng
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Zusammenfassung:In a method of processing a substrate, a first plasma may be generated from a first reaction gas. A second plasma may be generated from a second reaction gas. The first plasma and the second plasma may be individually applied to the substrate. Thus, each of the at least two remote plasma sources may generate at least two plasmas under different process recipes, which may be optimized for processing the substrate. As a result, the substrate processed using the optimal plasmas may have a desired shape.