APPARATUS AND METHOD OF TESTING AN ELECTRONIC DEVICE

APPARATUS AND METHOD OF TESTING AN ELECTRONIC DEVICE

An apparatus for testing an electronic device may include a field programmable gate array (FPGA), a test board, a test channel and a loop channel. The electronic device may be electrically connected to the test board. The test channel may be electrically connected between the electronic device and t...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: JEON HYUCK-SOO, CHOI JAE-IL, WOO KI-RYONG
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:An apparatus for testing an electronic device may include a field programmable gate array (FPGA), a test board, a test channel and a loop channel. The electronic device may be electrically connected to the test board. The test channel may be electrically connected between the electronic device and the FPGA via the test board. The loop channel may extend from the FPGA, may be connected to the FPGA via the test board, and may be used to test the test board.