APPARATUS AND METHOD FOR SELECTING WAVEFORM FOR SIDE-CHANNEL ANALYSIS

An apparatus and method for selecting a waveform for side-channel analysis are provided. The apparatus for selecting a waveform for side-channel analysis includes a matrix generation unit, a waveform transform unit, and a waveform selection unit. The matrix generation unit generates covariance matri...

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Bibliographische Detailangaben
Hauptverfasser:	YOON HYUK JOONG, CHOI HEE BONG, KO HAENG SEOK, PARK SANGWOO, KIM YONGDAE
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	An apparatus and method for selecting a waveform for side-channel analysis are provided. The apparatus for selecting a waveform for side-channel analysis includes a matrix generation unit, a waveform transform unit, and a waveform selection unit. The matrix generation unit generates covariance matrices based on waveforms collected by a waveform collection apparatus. The waveform transform unit determines a 1st principal component using the generated covariance matrices, and to transform the waveforms using the determined 1st principal component. The waveform selection unit selects a waveform for the side-channel analysis from the transformed waveforms.