METHOD FOR FABRICATING SEMICONDUCTOR DEVICE

A gate pattern is formed on a first region of a substrate. An epitaxial layer is formed on a second region of the substrate. A recess is formed in the second region of the substrate by etching the epitaxial layer and the substrate underneath. The first region is adjacent to the second region.

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Bibliographische Detailangaben
Hauptverfasser: UTOMO HENRY K, KOO KYUNG-BUM, CHA TAE-HO, JEON TAEK-SOO, HOLT JUDSON R, KIM JIN-BUM
Format: Patent
Sprache:eng
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Zusammenfassung:A gate pattern is formed on a first region of a substrate. An epitaxial layer is formed on a second region of the substrate. A recess is formed in the second region of the substrate by etching the epitaxial layer and the substrate underneath. The first region is adjacent to the second region.