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Methods and systems for determining a location of an object on a planar surface are provided. In one example, a method includes determining a receive angle of a first light beam based on a difference between a time the first light beam is received at the object and a time that the first light beam i...

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1. Verfasser: SPEARS KURT E
Format: Patent
Sprache:eng
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Zusammenfassung:Methods and systems for determining a location of an object on a planar surface are provided. In one example, a method includes determining a receive angle of a first light beam based on a difference between a time the first light beam is received at the object and a time that the first light beam is received at a calibration location. The method also includes determining a receive angle of a second light beam based on a difference between a time the second light beam is received at the object and a time that the second light beam is received at the calibration location. Finally, the method includes determining the position of the object based on the receive angle of the first light beam, the receive angle of the second light beam, the first source location, and the second source location.