TUNABLE LIGHT SOURCE SYSTEM WITH WAVELENGTH MEASUREMENT FOR A HYPER-SPECTRAL IMAGING SYSTEM

TUNABLE LIGHT SOURCE SYSTEM WITH WAVELENGTH MEASUREMENT FOR A HYPER-SPECTRAL IMAGING SYSTEM

A tunable light source system with wavelength measurement capability for a hyper-spectral imaging system is disclosed. A method includes reference filtering a portion of a tunable light beam while tuning the center wavelength, detecting with at least one photodetector the reference-filtered tunable...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: TOVEY CAMERON JOHN
Format: Patent
Sprache:eng
Schlagworte:
COLORIMETRY
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
PICTORIAL COMMUNICATION, e.g. TELEVISION
RADIATION PYROMETRY
TESTING
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Beschreibung
Zusammenfassung:A tunable light source system with wavelength measurement capability for a hyper-spectral imaging system is disclosed. A method includes reference filtering a portion of a tunable light beam while tuning the center wavelength, detecting with at least one photodetector the reference-filtered tunable light beam and generating therefrom at least one detector signal that varies with the center wavelength, and determining a tunable center wavelength based on the at least one detector signal.