Measuring Apparatus and Measuring Method

Provided are a measuring apparatus and method for obtaining a measurement value from a response to a signal applied to a sample, wherein the measuring apparatus includes a first measuring unit that measures a first electric response to a first signal that is input to a first pair of electrodes that...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: OKAMI AKIKO, FUKUDA KAZUO, MATSUDA HIROKAZU
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Provided are a measuring apparatus and method for obtaining a measurement value from a response to a signal applied to a sample, wherein the measuring apparatus includes a first measuring unit that measures a first electric response to a first signal that is input to a first pair of electrodes that can come into contact with a sample, a second measuring unit that measures a second electric response to a second signal that is input to a second pair of electrodes that can come into contact with the sample, the second signal changing its value from a first level to a second level and thereafter maintaining the second level for a certain period of time, as a peak value of a response signal with respect to the change in the second signal, and a control unit that corrects a value indicating the amount of a measuring target component of the sample, the value being obtained from the first electric response, based on the peak value of the response signal.