PROCESSES AND SYSTEMS FOR ENGINEERING A COPPER SURFACE FOR SELECTIVE METAL DEPOSITION

An integrated system for transferring and processing a substrate in a controlled environment to enable selective deposition of a thin layer of a cobalt-alloy material on a copper surface of a copper interconnect to improve electromigration performance of the copper interconnect, comprising: a lab-am...

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Bibliographische Detailangaben
Hauptverfasser: DORDI YEZDI, ARUNAGIRI TIRUCHIRAPALLI, HOWALD ARTHUR M, REDEKER FRITZ C, THIE WILLIAM, BOYD JOHN
Format: Patent
Sprache:eng
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Zusammenfassung:An integrated system for transferring and processing a substrate in a controlled environment to enable selective deposition of a thin layer of a cobalt-alloy material on a copper surface of a copper interconnect to improve electromigration performance of the copper interconnect, comprising: a lab-ambient transfer chamber; a substrate cleaning reactor coupled to the lab-ambient transfer chamber, wherein the substrate cleaning reactor cleans the substrate surface to remove metal-organic complex contaminants on the substrate surface; a vacuum transfer chamber; a vacuum process module for removing organic contaminants from the substrate surface; a controlled-ambient transfer chamber filled with an inert gas; and an electroless cobalt-alloy material deposition process module used to deposit the thin layer of cobalt-alloy material on the copper surface of the copper interconnect after the substrate surface has been removed of metallic contaminants and organic contaminants, and the copper surface has been removed of copper oxide.