SPECTROSCOPIC CAMERA AND ALIGNMENT ADJUSTMENT METHOD
A spectroscopic camera includes a light incident section provided with an incident angle limiter and first alignment marks, a wavelength tunable interference filter provided with second alignment marks, and a circuit substrate provided with an imaging device and third alignment marks. The amount of...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | A spectroscopic camera includes a light incident section provided with an incident angle limiter and first alignment marks, a wavelength tunable interference filter provided with second alignment marks, and a circuit substrate provided with an imaging device and third alignment marks. The amount of deviation of a mechanical central axis of each of the components from an ideal central axis thereof and the angle of rotation indicating the direction of the deviation are measured, and the positions of the first alignment marks and the second alignment marks relative to each other and the positions of the second alignment marks and the third alignment marks relative to each other are so adjusted that the ideal central axes coincide with one another. |
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