SCANNING LASER MICROSCOPE

Brightness information with a wide dynamic range is acquired and observed while preventing degradation of a detector. The invention provides a microscope system including a scanner that two-dimensionally scans laser light emitted from a light source unit on a specimen; a detector (41) that detects l...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: KUWABARA YOHEI, ARAYA AKINORI
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Brightness information with a wide dynamic range is acquired and observed while preventing degradation of a detector. The invention provides a microscope system including a scanner that two-dimensionally scans laser light emitted from a light source unit on a specimen; a detector (41) that detects light from the specimen on which the laser light is scanned by the scanner and outputs a light intensity signal corresponding to the light intensity of the detected light; a PC that converts the light intensity signal output from the detector (41) to brightness information at each pixel corresponding to the scanning position of the scanner and that generates an image of the specimen; a second integrating circuit (70) that calculates an integrated value corresponding to the total light intensity signal output from the detector (41) within a given time; a comparator (55) that determines whether or not that integrated value of a voltage signal exceeds a prescribed threshold; and a high-voltage control portion (87) that stops detection of light by the detector (41) when it is determined by the comparator (55) that the voltage signal exceeds the prescribed threshold.