METHOD AND APPARATUS FOR DEFINING A Z-RANGE IN A SAMPLE, IN WHICH A Z-STACK OF THE SAMPLE IS TO BE RECORDED BY MEANS OF A MICROSCOPE

METHOD AND APPARATUS FOR DEFINING A Z-RANGE IN A SAMPLE, IN WHICH A Z-STACK OF THE SAMPLE IS TO BE RECORDED BY MEANS OF A MICROSCOPE

A method for defining a z-range in a sample in which a z-stack of the sample is to be recorded by means of a microscope is provided, wherein the z-range is defined automatically on the basis of a z-value situated in the sample and taking at least one predetermined parameter into account.

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Bibliographische Detailangaben
Hauptverfasser: SVEJDAR DANIEL, EICHINGER MARKUS, WOLFF HORST
Format: Patent
Sprache:eng
Schlagworte:
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
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Beschreibung
Zusammenfassung:A method for defining a z-range in a sample in which a z-stack of the sample is to be recorded by means of a microscope is provided, wherein the z-range is defined automatically on the basis of a z-value situated in the sample and taking at least one predetermined parameter into account.