Methods and Systems for Multiple Charge Correction of Electrical Mobility Spectrometer Data

Systems and methods for determining particle size distribution from electrical mobility spectrometry (EMS) measurements in the presence of multiply charged particles. EMS data comprising zeroth order singly-charged particle size distribution information for one or more EMS channels is obtained and f...

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Hauptverfasser: HE MEILU, DHANIYALA SURESH
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Systems and methods for determining particle size distribution from electrical mobility spectrometry (EMS) measurements in the presence of multiply charged particles. EMS data comprising zeroth order singly-charged particle size distribution information for one or more EMS channels is obtained and fitted using a Gumbel distribution function to obtain a fit function value. The obtained fit function value is used to correct for multiply-charged particle contribution to the received EMS data.