METHODS AND APPARATUS FOR DEFINING A PROBE CONFIGURATION USING A PROBE CONFIGURATION TOOL

METHODS AND APPARATUS FOR DEFINING A PROBE CONFIGURATION USING A PROBE CONFIGURATION TOOL

A method for defining a probe configuration using an interactive probe configuration tool is provided. The probe configuration tool comprises a shaft icon displayed on the probe configuration tool, and a probe position indicator configured to display an orientation of at least one first probe icon r...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: ABBOTT BRIAN DEAN, TAPPAN JACQUELINE MARIE, ALLDREDGE GREGORY MARK, MARSHALL DONALD EVAN, FROGGET DARYL RONALD
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A method for defining a probe configuration using an interactive probe configuration tool is provided. The probe configuration tool comprises a shaft icon displayed on the probe configuration tool, and a probe position indicator configured to display an orientation of at least one first probe icon relative to the shaft icon. The probe position indicator is further configured to modify the orientation of the at least one first probe icon based on input from a user. The probe configuration tool further comprises a probe type indicator configured to display a type of the at least one first probe icon, wherein the probe position indicator and the probe type indicator are simultaneously displayed on a presentation interface.