SYSTEMS AND METHODS FOR DUAL ENERGY IMAGING

SYSTEMS AND METHODS FOR DUAL ENERGY IMAGING

A method for processing projection data is provided. The method includes acquiring projection data of an object including a high-energy projection value and a low-energy projection value for each of a plurality of measurements, adjusting, for each measurement pair, the high- and low-energy projectio...

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Hauptverfasser: LANGAN DAVID ALLEN, EDIC PETER MICHAEL, WILSON COLIN RICHARD
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator LANGAN DAVID ALLEN
EDIC PETER MICHAEL
WILSON COLIN RICHARD
description A method for processing projection data is provided. The method includes acquiring projection data of an object including a high-energy projection value and a low-energy projection value for each of a plurality of measurements, adjusting, for each measurement pair, the high- and low-energy projection values until a projection value difference between the high- and low-energy projection values is within a predetermined range of acceptable projection value differences, and generating an image of the object based on the adjusted high- and low-energy projection values.
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subjects CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title SYSTEMS AND METHODS FOR DUAL ENERGY IMAGING
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