SYSTEMS AND METHODS FOR DUAL ENERGY IMAGING

SYSTEMS AND METHODS FOR DUAL ENERGY IMAGING

A method for processing projection data is provided. The method includes acquiring projection data of an object including a high-energy projection value and a low-energy projection value for each of a plurality of measurements, adjusting, for each measurement pair, the high- and low-energy projectio...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: LANGAN DAVID ALLEN, EDIC PETER MICHAEL, WILSON COLIN RICHARD
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A method for processing projection data is provided. The method includes acquiring projection data of an object including a high-energy projection value and a low-energy projection value for each of a plurality of measurements, adjusting, for each measurement pair, the high- and low-energy projection values until a projection value difference between the high- and low-energy projection values is within a predetermined range of acceptable projection value differences, and generating an image of the object based on the adjusted high- and low-energy projection values.