TEST CIRCUIT HAVING SCAN WARM-UP

TEST CIRCUIT HAVING SCAN WARM-UP

A test circuit for a functional circuit includes a scan chain coupled to the functional circuit, and a controller coupled to the scan chain, for controlling the scan chain to scan a test pattern into the scan chain, and subsequently and repetitively for a multiple number of times launch the test pat...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: GORTI ATCHYUTH K, WINGFIELD JAMES A, GILES GRADY L
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A test circuit for a functional circuit includes a scan chain coupled to the functional circuit, and a controller coupled to the scan chain, for controlling the scan chain to scan a test pattern into the scan chain, and subsequently and repetitively for a multiple number of times launch the test pattern to the functional circuit, capture test data into the scan chain, and restore the test pattern in the scan chain for subsequent launch.