ENFORCING PERFORMANCE LONGEVITY ON SEMICONDUCTOR DEVICES

Technologies for enforcing an expiration policy on an electronic engineering sample component includes a one-time programmable fuse to store a manufacture date of the electronic engineering sample component, another one-time programmable fuse to store an expiration date of the electronic engineering...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: PRAKASH GYAN, NASSIB ABDI
Format: Patent
Sprache:eng
Schlagworte:
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