ENFORCING PERFORMANCE LONGEVITY ON SEMICONDUCTOR DEVICES

Technologies for enforcing an expiration policy on an electronic engineering sample component includes a one-time programmable fuse to store a manufacture date of the electronic engineering sample component, another one-time programmable fuse to store an expiration date of the electronic engineering sample component, and a component life management engine to compare a current date of the electronic engineering sample component with the expiration date of the electronic engineering sample component. The component life management engine to disable or lock the electronic engineering sample component in response to determining that the current date of the electronic engineering sample component exceeds the expiration date of the electronic engineering sample component. In some embodiments, a computing device may enforce the expiration policy for the electronic engineering sample component. The computing device may also be communicatively coupled to a remote unlock server and may receive authorization to unlock a disabled engineering sample component.