PROBE HEAD TEST FIXTURE AND METHOD OF USING THE SAME
Various probe testing load board structures and methods of using the same are disclosed. In one aspect, a method of testing a load board of a probe testing system is provided. The method includes electrically engaging a shorting substrate with conductor structures of the load board. The shorting sub...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | SURELL DENNIS GLENN L |
| description | Various probe testing load board structures and methods of using the same are disclosed. In one aspect, a method of testing a load board of a probe testing system is provided. The method includes electrically engaging a shorting substrate with conductor structures of the load board. The shorting substrate is operable to establish one or more electrical pathways between the tester and at least one electronic component of the load board. An electrical test is performed on the at least one electronic component using the one or more electrical pathways. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2014084956A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2014084956A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2014084956A13</originalsourceid><addsrcrecordid>eNrjZDAJCPJ3clXwcHV0UQhxDQ5RcPOMCAkNclVw9HNR8HUN8fB3UfB3UwgN9vRzVwjxcFUIdvR15WFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8aHBRgaGJgYWJpamZo6GxsSpAgAvdSfk</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>PROBE HEAD TEST FIXTURE AND METHOD OF USING THE SAME</title><source>esp@cenet</source><creator>SURELL DENNIS GLENN L</creator><creatorcontrib>SURELL DENNIS GLENN L</creatorcontrib><description>Various probe testing load board structures and methods of using the same are disclosed. In one aspect, a method of testing a load board of a probe testing system is provided. The method includes electrically engaging a shorting substrate with conductor structures of the load board. The shorting substrate is operable to establish one or more electrical pathways between the tester and at least one electronic component of the load board. An electrical test is performed on the at least one electronic component using the one or more electrical pathways.</description><language>eng</language><subject>CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ; ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC ; GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS ; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; PRINTED CIRCUITS ; TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION ; TECHNICAL SUBJECTS COVERED BY FORMER USPC ; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS ; TESTING</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140327&DB=EPODOC&CC=US&NR=2014084956A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76419</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140327&DB=EPODOC&CC=US&NR=2014084956A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SURELL DENNIS GLENN L</creatorcontrib><title>PROBE HEAD TEST FIXTURE AND METHOD OF USING THE SAME</title><description>Various probe testing load board structures and methods of using the same are disclosed. In one aspect, a method of testing a load board of a probe testing system is provided. The method includes electrically engaging a shorting substrate with conductor structures of the load board. The shorting substrate is operable to establish one or more electrical pathways between the tester and at least one electronic component of the load board. An electrical test is performed on the at least one electronic component using the one or more electrical pathways.</description><subject>CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS</subject><subject>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC</subject><subject>GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS</subject><subject>MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>PRINTED CIRCUITS</subject><subject>TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION</subject><subject>TECHNICAL SUBJECTS COVERED BY FORMER USPC</subject><subject>TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDAJCPJ3clXwcHV0UQhxDQ5RcPOMCAkNclVw9HNR8HUN8fB3UfB3UwgN9vRzVwjxcFUIdvR15WFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8aHBRgaGJgYWJpamZo6GxsSpAgAvdSfk</recordid><startdate>20140327</startdate><enddate>20140327</enddate><creator>SURELL DENNIS GLENN L</creator><scope>EVB</scope></search><sort><creationdate>20140327</creationdate><title>PROBE HEAD TEST FIXTURE AND METHOD OF USING THE SAME</title><author>SURELL DENNIS GLENN L</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2014084956A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2014</creationdate><topic>CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS</topic><topic>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC</topic><topic>GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS</topic><topic>MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>PRINTED CIRCUITS</topic><topic>TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION</topic><topic>TECHNICAL SUBJECTS COVERED BY FORMER USPC</topic><topic>TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SURELL DENNIS GLENN L</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SURELL DENNIS GLENN L</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PROBE HEAD TEST FIXTURE AND METHOD OF USING THE SAME</title><date>2014-03-27</date><risdate>2014</risdate><abstract>Various probe testing load board structures and methods of using the same are disclosed. In one aspect, a method of testing a load board of a probe testing system is provided. The method includes electrically engaging a shorting substrate with conductor structures of the load board. The shorting substrate is operable to establish one or more electrical pathways between the tester and at least one electronic component of the load board. An electrical test is performed on the at least one electronic component using the one or more electrical pathways.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US2014084956A1 |
| source | esp@cenet |
| subjects | CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PRINTED CIRCUITS TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION TECHNICAL SUBJECTS COVERED BY FORMER USPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS TESTING |
| title | PROBE HEAD TEST FIXTURE AND METHOD OF USING THE SAME |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-08T03%3A21%3A13IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SURELL%20DENNIS%20GLENN%20L&rft.date=2014-03-27&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2014084956A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |