PROBE HEAD TEST FIXTURE AND METHOD OF USING THE SAME

Various probe testing load board structures and methods of using the same are disclosed. In one aspect, a method of testing a load board of a probe testing system is provided. The method includes electrically engaging a shorting substrate with conductor structures of the load board. The shorting sub...

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Bibliographische Detailangaben
1. Verfasser:	SURELL DENNIS GLENN L
Format:	Patent
Sprache:	eng
Schlagworte:	CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PRINTED CIRCUITS TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION TECHNICAL SUBJECTS COVERED BY FORMER USPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS TESTING
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Beschreibung
Zusammenfassung:	Various probe testing load board structures and methods of using the same are disclosed. In one aspect, a method of testing a load board of a probe testing system is provided. The method includes electrically engaging a shorting substrate with conductor structures of the load board. The shorting substrate is operable to establish one or more electrical pathways between the tester and at least one electronic component of the load board. An electrical test is performed on the at least one electronic component using the one or more electrical pathways.