PROCESS MODEL GENERATION AND WEAK-SPOT ANALYSIS FROM PLAIN EVENT LOGS

PROCESS MODEL GENERATION AND WEAK-SPOT ANALYSIS FROM PLAIN EVENT LOGS

Various embodiments of systems and methods for process model extraction and weak-spot analysis from plain event logs are described herein. In an aspect, the method involves obtaining an event log that includes events grouped by process instances. Based on analyzing the event log a process graph is g...

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Bibliographische Detailangaben
Hauptverfasser: KIESELBACH OLIVER, ZIMMERMANN BIRGIT, DRITTLER BERNHARD, DOEHRING MARKUS, MUELLER ALEXANDER CHRISTIAN
Format: Patent
Sprache:eng
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COMPUTING
COUNTING
DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES
PHYSICS
SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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Zusammenfassung:Various embodiments of systems and methods for process model extraction and weak-spot analysis from plain event logs are described herein. In an aspect, the method involves obtaining an event log that includes events grouped by process instances. Based on analyzing the event log a process graph is generated. In another aspect, one or more visual representations of the generated process graph, indicating the weak-spots, are generated. At least one of the one or more visual representations of the process model is rendered in response to receiving a selection of the at least one visual representation. In yet another aspect, the weak-spots are transformed into a data structure and provided as input to a rule mining algorithm for generating a set of rules defining the weak-spots. The set of rules received from the rule mining algorithm are rendered on a graphical user interface (GUI).