DEVICE FOR TESTING ELECTRONIC COMPONENT DEVICES
A device for testing electronic component devices mounted on a substrate, having test pins which can be placed on contact surfaces of the substrate. A frame-like support structure is provided, which supports the substrate such that the individual component devices are located in open spaces of the s...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | A device for testing electronic component devices mounted on a substrate, having test pins which can be placed on contact surfaces of the substrate. A frame-like support structure is provided, which supports the substrate such that the individual component devices are located in open spaces of the support structure. |
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