Transistor Overcurrent Detection

Circuits and methods for overcurrent fault detection using a debounce timer to qualify the presence of an overcurrent fault based on an overcurrent signal being asserted for at least a predetermined time interval. The debounce timer may be used in conjunction with state-qualified fault sensing and/o...

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1. Verfasser: CHRISTIE ROBERT DOUGLAS
Format: Patent
Sprache:eng
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Zusammenfassung:Circuits and methods for overcurrent fault detection using a debounce timer to qualify the presence of an overcurrent fault based on an overcurrent signal being asserted for at least a predetermined time interval. The debounce timer may be used in conjunction with state-qualified fault sensing and/or blank-time-qualified fault sensing.