FINE PARTICLE MEASUREMENT DEVICE

FINE PARTICLE MEASUREMENT DEVICE

A fine particle measurement device includes a 4f optical system in an optical path that causes a beam spot of a laser output from a light source to form an image with respect to fine particles.

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1. Verfasser: SEO KATSUHIRO
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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description A fine particle measurement device includes a 4f optical system in an optical path that causes a beam spot of a laser output from a light source to form an image with respect to fine particles.
format Patent
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title FINE PARTICLE MEASUREMENT DEVICE
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