FINE PARTICLE MEASUREMENT DEVICE

A fine particle measurement device includes a 4f optical system in an optical path that causes a beam spot of a laser output from a light source to form an image with respect to fine particles.

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Bibliographische Detailangaben
1. Verfasser:	SEO KATSUHIRO
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	A fine particle measurement device includes a 4f optical system in an optical path that causes a beam spot of a laser output from a light source to form an image with respect to fine particles.