METHODS AND APPARATUS TO APPLY MULTIPLE TRIP LIMITS TO A DEVICE IN A PROCESS CONTROL SYSTEM

Methods and apparatus to apply multiple trip limits to a device in a process control system are disclosed. An example method involves monitoring a value of a parameter associated with the operation of the device and receiving an input indicative of an operational state of the device, where a first i...

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Bibliographische Detailangaben
Hauptverfasser:	SMITH DAVID MARK, BELLVILLE KEITH RICHARD, LAW GARY KEITH, SHERRIFF GODFREY R
Format:	Patent
Sprache:	eng
Schlagworte:	CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING
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Beschreibung
Zusammenfassung:	Methods and apparatus to apply multiple trip limits to a device in a process control system are disclosed. An example method involves monitoring a value of a parameter associated with the operation of the device and receiving an input indicative of an operational state of the device, where a first input indicates a first operational state and a second input indicates a second operational state. If the first input is received, comparing via a function block the value of the parameter to a first trip limit, and if the second input is received, comparing via the function block the value of the parameter to a second trip limit, and implementing a response based on the comparison.