METHOD OF VALUING A PATENT USING METRIC CHARACTERISTICS OF SIMILAR PATENTS GRANTED EARLIER

METHOD OF VALUING A PATENT USING METRIC CHARACTERISTICS OF SIMILAR PATENTS GRANTED EARLIER

A method of valuing a patent using metric characteristics of similar patents granted earlier, whereas said metrics comprise a variety of estimated future characteristics, normalized using estimated future market size. Similar patents are identified using a combination of one or more metric character...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: LANE MARK T, POWELL, JR. G. EDWARD, WHITE N. EDWARD
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES
PHYSICS
SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:A method of valuing a patent using metric characteristics of similar patents granted earlier, whereas said metrics comprise a variety of estimated future characteristics, normalized using estimated future market size. Similar patents are identified using a combination of one or more metric characteristics, for example, patent value estimate, semantic similarity, dependent claim counts, cited patent counts, word counts, patent counts within assigned classes/subclasses, and distinct assignee counts.