MODIFICATION OF SOLID STATE CdZnTe (CZT) RADIATION DETECTORS WITH HIGH SENSITIVITY OR HIGH RESOLUTION OPERATION

MODIFICATION OF SOLID STATE CdZnTe (CZT) RADIATION DETECTORS WITH HIGH SENSITIVITY OR HIGH RESOLUTION OPERATION

An apparatus and process is provided to illustrate the manipulation of the internal electric field of CZT using multiple wavelength light illumination on the crystal surface at RT. The control of the internal electric field is shown through the polarization in the IR transmission image under illumin...

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Bibliographische Detailangaben
Hauptverfasser: WASHINGTON, II AARON L, DUFF MARTINE C, GROZA MICHAEL, TEAGUE LUCILE C, BURGER ARNOLD
Format: Patent
Sprache:eng
Schlagworte:
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:An apparatus and process is provided to illustrate the manipulation of the internal electric field of CZT using multiple wavelength light illumination on the crystal surface at RT. The control of the internal electric field is shown through the polarization in the IR transmission image under illumination as a result of the Pockels effect.