Systems and Methods for Investigating a Characteristic of a Material Using Electron Microscopy

Various embodiments of the present invention provide systems and methods for determining an characteristic of a material. The characteristics may include, but are not limited to, crystallographic and chemical composition characteristics of a material.

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Bibliographische Detailangaben
Hauptverfasser:	CHAN LISA H, WRIGHT STUART I, NYLESE TERA LYNN, DE KLOE PETER A, NOWELL MATHEW M
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	Various embodiments of the present invention provide systems and methods for determining an characteristic of a material. The characteristics may include, but are not limited to, crystallographic and chemical composition characteristics of a material.