VISUALIZING SENSITIVITY INFORMATION IN INTEGRATED CIRCUIT DESIGN

A method, system, and computer program product for visualizing sensitivity information in integrated circuit (IC) design are provided in the illustrative embodiments. A plurality of sensitivity information corresponding to a first component in the IC design is received, wherein the plurality of sens...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	GATTIKER ANNE ELIZABETH, NASSIF SANI RICHARD
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION ORPROCESSING OF GOODS COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS PHYSICS TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINSTCLIMATE CHANGE
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	A method, system, and computer program product for visualizing sensitivity information in integrated circuit (IC) design are provided in the illustrative embodiments. A plurality of sensitivity information corresponding to a first component in the IC design is received, wherein the plurality of sensitivity information includes a first sensitivity information indicating a first variation in a first electrical characteristic of a group of components as a result of a variation in an electrical characteristic of the first component. A plurality of aspects of the first sensitivity information are rendered in visual form to form a first visualization. The first visualization is presented on a schematic view of the IC design in an IC design tool such that the first sensitivity information is visually associated with the first component in the IC design.