ELECTRICAL CHARACTERISTIC MEASURING APPARATUS AND METHOD OF SOLAR CELL
In one exemplary embodiment, an electrical characteristic measuring apparatus of solar cell comprises a resilient metal attached to a bus bar of a solar cell and a conducting device located at one end of the resilient metal. The resilient metal has an open via, and the conducting device contacts wit...
Gespeichert in:
Hauptverfasser: | , , , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | In one exemplary embodiment, an electrical characteristic measuring apparatus of solar cell comprises a resilient metal attached to a bus bar of a solar cell and a conducting device located at one end of the resilient metal. The resilient metal has an open via, and the conducting device contacts with the bus bar through the open via. The electrical characteristic measuring apparatus is attached to the bus bar located at a front plane of solar cell. The resilient metal and the conducting device, respectively, connect electrically to a testing device contacted to electrode located at the back plane of solar cell. Thus the resilient metal, the testing device, and the electrode of the back plane form a current measuring loop, and the conducting device, the testing device, and the electrode of the back plane form a voltage measuring loop. |
---|