SUBSTRATE INSPECTION JIG AND SUBSTRATE INSPECTION METHOD

A substrate inspection jig for use in inspection of an electrical property of a printed board to be inspected on which an electronic component is mounted includes a spacer which is mounted on the printed board to be inspected, a conductive plate which is connected to the spacer, and is disposed alon...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	MIURA YUJI, NAGAI SHINJI, SHIKI TOMOHIKO, TANABE KATSUHIRO, SADAKANE YASUKAZU, KAWAKAMI TOMOKO, MIYANISHI KEISHI, WATANABE HIDEO, SHIBASAKI TADAYOSHI, INAKAZU HIROYUKI
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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