CONTROL EXPOSURE

CONTROL EXPOSURE

Control exposure techniques are described. In one or more implementations, a determination is made by a computing device as to which of a plurality of controls correspond to one or more inputs detected using one or more magnetometers, cameras, or microphones. A result of the determination is exposed...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: GUP JEREMY B, EWANCHUK BRIAN J, OLSON LAWRENCE W, KAZA AKHILESH, HILLBERG MICHAEL J, LAMB AUSTIN M
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Beschreibung
Zusammenfassung:Control exposure techniques are described. In one or more implementations, a determination is made by a computing device as to which of a plurality of controls correspond to one or more inputs detected using one or more magnetometers, cameras, or microphones. A result of the determination is exposed by the computing device to one or more applications that are executed by the computing device.