VOID FREE INTERLAYER DIELECTRIC

A method of manufacturing a non-volatile memory device includes forming a number of memory cells. The method also includes depositing a first dielectric layer over the memory cells, where the first dielectric layer is a conformal layer having a substantially uniform thickness. The method further inc...

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Bibliographische Detailangaben
Hauptverfasser: NGO MINH VAN, HUI ANGELA T, TOKUNO HIROKAZU, LI WENMEI, THIO HSIAO-HAN
Format: Patent
Sprache:eng
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Zusammenfassung:A method of manufacturing a non-volatile memory device includes forming a number of memory cells. The method also includes depositing a first dielectric layer over the memory cells, where the first dielectric layer is a conformal layer having a substantially uniform thickness. The method further includes depositing a second dielectric layer over the first dielectric layer. Together, the first and second dielectric layers form an interlayer dielectric without voids.