INSERT FOR SEMICONDUCTOR PACAKGE AND TESTING APPARATUS WITH THE SAME

INSERT FOR SEMICONDUCTOR PACAKGE AND TESTING APPARATUS WITH THE SAME

An insert for a semiconductor package testing apparatus comprises a body having a pocket constructed and arranged to receive the semiconductor package, and a sliding tool slidingly positioned on the body. The sliding tool is constructed and arranged to open and close the pocket as a result of a slid...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: LEE SEUNGHEE, CHOI GUIHEUM, KANG MINSU, UM TEASEOG
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:An insert for a semiconductor package testing apparatus comprises a body having a pocket constructed and arranged to receive the semiconductor package, and a sliding tool slidingly positioned on the body. The sliding tool is constructed and arranged to open and close the pocket as a result of a sliding motion of the sliding tool relative to the body.