METHOD AND APPARATUS FOR DETERMINING PLANAR IMPEDANCE TOMOGRAPHY

METHOD AND APPARATUS FOR DETERMINING PLANAR IMPEDANCE TOMOGRAPHY

A method and apparatus for determining planar impedance tomography of a sample comprising a measurement head unit comprising an impedance sensor; a three-axis actuator assembly, coupled to the measurement head unit, for positioning the impedance sensor relative to a sample; a controller, coupled to...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: JESSEN TODD L, GOLT MICHAEL C, BRATCHER MATTHEW S
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A method and apparatus for determining planar impedance tomography of a sample comprising a measurement head unit comprising an impedance sensor; a three-axis actuator assembly, coupled to the measurement head unit, for positioning the impedance sensor relative to a sample; a controller, coupled to the three-axis actuator assembly, for controlling the three-axis actuator assembly to position the impedance sensor at a plurality of locations relative to the sample; and an impedance analyzer, coupled to the impedance sensor, for determining an impedance value at each location in the plurality of locations.