SYSTEMS AND METHODS OF MANAGING DEVICE PARAMETER VALUES WHEN IMPORTING DEVICE DEFINITION FILES

SYSTEMS AND METHODS OF MANAGING DEVICE PARAMETER VALUES WHEN IMPORTING DEVICE DEFINITION FILES

An industrial process control system includes a field device having a first plurality of device parameter values corresponding to a plurality of device parameters. The industrial process control system also includes a processor configured to determine a second plurality of device parameter values, c...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: MCMILLAN DAVID EVANS, KREFT DANA ROBERT, GALT WILLIAM KENNEDY, SOCKY DAVID RICHARD
Format: Patent
Sprache:eng
Schlagworte:
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
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Beschreibung
Zusammenfassung:An industrial process control system includes a field device having a first plurality of device parameter values corresponding to a plurality of device parameters. The industrial process control system also includes a processor configured to determine a second plurality of device parameter values, corresponding to the plurality of device parameters, from a device definition (DD) file. The processor is also configured to present a reconciliation tool comprising a first portion of the plurality of device parameters, the corresponding first plurality of device parameter values, and the corresponding second plurality of device parameter values. The processor is also configured to set a second portion of the plurality of device parameters to the corresponding second plurality of device parameter values based on instructions received from the reconciliation tool.